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The TCF command language operates on both sequential and VSAM data sets. TCF processing consists of a catalog scan, data set selection, and compression analysis. Within a single execution of the program, you can run multiple sets of TCF processing. In order to remove redundant data set selections, TCF preprocesses the scans and combines them so that no data set is selected twice for a single analysis operation (EXAMINE statement—see in the following table).
There are three types of operations done in the command language:
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TCF Statements |
Operation |
|---|---|
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SCAN |
Search catalog(s) and gather a list of data sets using criteria you specify |
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SELECT and EXCLUDE |
Narrow the list of data set names using criteria you specify. |
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EXAMINE |
Test compress the data sets in the final list and produce a report. |
TCF requires at least one SCAN statement and one EXAMINE statement.
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