Overview › The Options in More Detail › Event Capture Option

Event Capture Option

The CA SYSVIEW Event Capture Option provides an automated and fully customizable data gathering tool. This option lets you collect and analyze historical and captured event data for problem determination or systems tuning.

The Event Capture Option lets you:

• Capture any CA SYSVIEW command
• Specify the level of data that is collected
• Specify when it is collected
• Specify how long to retain the information
• View or analyze the data on any system at any time

This option enables the SYSVIEW RMF historical displays.

For more information, see the chapter “Event Capture” in the Administration Guide.