7. PARAMETERS › 7.2 Complex Level Parameters › 7.2.5 Device Level I/O Activity Data Elements(SMFDEVS) › 7.2.5.1 What are I/O Activity Data Elements?

7.2.5.1 What are I/O Activity Data Elements?

By default, the CA MICS Batch and Operations Analyzer
interval, step, and job-level database records contain I/O
activity data elements summarized to the device class level.
These I/O related data elements are derived from the
individual SMF type 30 address space records EXCP segments.

A set of I/O activity metrics are provided for the following
device classes:

   Device Classes       I/O Data Element Structure
   ---------------      --------------------------
   COMMUNICATION        fff*COMM and fffMX#CO
   DASD                 fff*DASD and fffMX#DA
   GRAPHICS             fff*GRAF and fffMX#GR
   TAPE                 fff*TAPE and fffMX#TA
   UNIT-RECORD          fff*UREC and fffMX#UR
   VIRTUAL I/O          fff*VIO  and fffMX#VI
   TAPE CARTRIDGE       fff*3480 and fffMX#CA  (See Note)

   where fff is PGM or JOB for the step/interval and job-
                level files respectively

         *   is E for EXCP Count
                A for Data Set Allocations
                N for Number of Devices
                C for Device Connect Time

         #   is N for Number of Devices
                A for Data Set Allocations

   For example, in a BATPGM01 observation, data element
   PGMCDASD contains the sum of device connect time from all
   SMF type 30 record EXCP segments where the device class
   was DASD (HEX '20' in the raw data).

   Note:  The above list of device classes has one anomaly.
   Device Class TAPE CARTRIDGE is a subset of device class
   TAPE, rather than a unique device class.  Device class
   TAPE data elements contain both round reel and cartridge
   I/O activity.  Device Class TAPE CARTRIDGE contains the
   subset of TAPE activity where the device was a cartridge
   device.  Refer to section 6.6 for more information on
   device I/O activity metrics.